Temperature control of micromachined transducers

ABSTRACT

A micromachined structure, comprises a substrate and a cavity in the substrate. The micromachined structure comprises a membrane layer disposed over the substrate and spanning the cavity.

CROSS-REFERENCE TO RELATED APPLICATIONS

The present application is a continuation-in-part under 37 C.F.R.§1.53(b) of commonly owned U.S. patent application Ser. No. 12/495,443,entitled “Piezoelectric Micromachined Transducers” to David Martin, etal., and filed on Jun. 30, 2009. Priority to the cross-referenced parentapplication is claimed in accordance with 35 U.S.C. §120, and the entiredisclosure of U.S. patent application Ser. No. 12/495,443 isspecifically incorporated herein by reference.

BACKGROUND

Transducers such as ultrasonic transducers are provided in a widevariety of electronic applications. As the need to reduce the size ofmany components continues, the demand for reduced-size transducerscontinues to increase as well. This has lead to comparatively smalltransducers, which may be micromachined according to technologies suchas micro-electromechanical systems (MEMS) technology. One type oftransducer is a piezoelectric micromachined transducer (PMT). The PMTincludes a layer of piezoelectric material between two conductive plates(electrodes) thereby forming a membrane. When functioning as a receiver,an acoustic wave incident on the membrane results in the application ofa time varying force to the piezoelectric material. Application of thetime-varying force to a piezoelectric material results in inducedstresses in the piezoelectric material, which in-turn creates atime-varying voltage signal across the material. This lime-varyingvoltage signal may be measured by sensor circuits to determine thecharacteristics of the incident acoustic wave. Alternatively, thistime-varying voltage signal may produce a time-varying charge that isprovided to sensor circuits that process the signal and determine thecharacteristics of the incident acoustic wave. When functioning as atransmitter, a voltage excitation produces vibration of the diaphragm.This in turn radiates acoustic energy into the air (or any gaseousmedium).

Ultrasonic devices, such as ultrasonic transducers, typically operate ata resonance condition to improve sensitivity in both receive mode andtransmit mode. Accordingly, it is useful for the transducer to functionat a comparatively accurate resonant frequency, and for multipletransducers designed for use at the selected resonant frequency to befabricated with such accuracy with repeatability. One drawback to manyknown PMT structures relates to a lack of repeatability of the resonancefrequency from PMT to PMT. To this end, PMTs for certain applications,such as mics rely on the flexure mode of the membrane rather thanlongitudinal modes. While the resonant frequency of longitudinal modesis not significantly affected by film stress, the resonant frequency offlexural modes is highly dependent on film stress. Thus, variation infilm stress can impact the operational characteristics of transducersdesigned for flexural mode operation.

Another source of stress in PMTs is temperature. As is known, everymaterial has a coefficient of thermal expansion (T_(CE)). Thus amaterial expands or contracts in proportion to this coefficient. Theexpansion or contraction of a material induces stress in the material,and mismatches in T_(CE) between different materials comprising the PMTwill result in stress in the membrane layer. The stress in the membranelayer can impact the resonance frequency and the sensitivity of themembrane and thereby the PMT.

There is a need, therefore, for a transducer structure that addresses atleast the shortcomings described above.

SUMMARY

In accordance with an illustrative embodiment, a micromachinedstructure,

comprises a substrate having a first coefficient of thermal expansion.The micromachined structure comprises a cavity in the substrate and amembrane layer having a second coefficient of thermal expansion anddisposed over the substrate and spanning the cavity, wherein the firstcoefficient of thermal expansion is substantially identical to thesecond coefficient of thermal expansion. The micromachined structurecomprises an annular resonator disposed over the membrane and comprisinga first electrode, a second electrode and a piezoelectric layer betweenthe first and second electrodes.

In accordance with another illustrative embodiment, a method offabricating a piezoelectric micromachined transducer (PMT) comprises:providing a substrate comprising a surface and an opposing surface;forming a cavity in the substrate; forming a membrane layer over thesurface and substantially spanning the cavity; and forming an annulartransducer over the membrane layer, the annular transducer comprising afirst electrode, a second electrode and a piezoelectric layer betweenthe first electrode and the second electrode.

In accordance with another illustrative embodiment, a piezoelectricmicromachined transducer (PMT) array comprises a substrate and aplurality of PMTs arranged over the substrate. Each of the PMTscomprises a cavity in the substrate; a membrane layer disposed over thesubstrate and spanning the cavity; and an annular resonator disposedover the membrane. The annular resonator comprises a first electrode, asecond electrode and a piezoelectric layer between the first and secondelectrodes.

BRIEF DESCRIPTION OF THE DRAWINGS

The representative embodiments are best understood from the followingdetailed description when read with the accompanying drawing figures. Itis emphasized that the various features are not necessarily drawn toscale. In fact, the dimensions may be arbitrarily increased or decreasedfor clarity of discussion. Wherever applicable and practical, likereference numerals refer to like elements.

FIG. 1 shows a cross-sectional view of a PMT in accordance with arepresentative embodiment.

FIGS. 2A-2F shows cross-sectional views of a fabrication sequence inaccordance with a representative embodiment.

FIG. 3 shows a cross-sectional view of a PMT in accordance with arepresentative embodiment.

FIGS. 4A-4C show a fabrication sequence of a PMT in cross-section andtop view in accordance with a representative embodiment.

FIG. 5 shows a cross-sectional view of a PMT in accordance with arepresentative embodiment.

DEFINED TERMINOLOGY

The terms ‘a’ or ‘an’, as used herein are defined as one or more thanone.

The term ‘plurality’ as used herein is defined as two or more than two.

As used in the specification and appended claims, and in addition totheir ordinary meanings, the terms ‘substantial’ or ‘substantially’ meanto with acceptable limits or degree. For example, ‘substantiallycancelled’ means that one skilled in the art would consider thecancellation to be acceptable.

As used in the specification and the appended claims and in addition toits ordinary meaning, the term ‘approximately’ means to within anacceptable limit or amount to one having ordinary skill in the art. Forexample, ‘approximately the same’ means that one of ordinary skill inthe art would consider the items being compared to be the same.

DETAILED DESCRIPTION

In the following detailed description, for purposes of explanation andnot limitation, specific details are set forth in order to provide athorough understanding of example embodiments according to the presentteachings. However, it will be apparent to one having ordinary skill inthe art having had the benefit of the present disclosure that otherembodiments according to the present teachings that depart from thespecific details disclosed herein remain within the scope of theappended claims. Moreover, descriptions of materials and methods may beomitted so as to avoid obscuring the description of the illustrativeembodiments. Nonetheless, such materials and methods that are within thepurview of one of ordinary skill in the art may be used in accordancewith the illustrative embodiments. Such materials and methods areclearly within the scope of the present teachings. The piezoelectrictransducers of the representative embodiments are contemplated for usein a variety of electronic devices.

A representative electronic device may be a portable device such as amobile phone, a camera, a video camera, a personal digital assistant(PDA), a sound recording device, a laptop computer, a tablet computer, ahandheld computer, a handheld remote, or an electronic device thatcomprises the functionality of one or more of these devices. Moreover,the piezoelectric transducers of the representative embodiments arecontemplated for use in disparate applications such as industrialautomation, (e.g., liquid level sensing), detecting the presence of anobject, and measuring gas flow. Additionally, the piezoelectrictransducers of the representative embodiments can be used to detectmis-feed in automatic paper feeders in printers and scanners.

It is emphasized that the noted devices are merely illustrative and thatother devices are contemplated. In some representative embodiments, theelectronic device is a device that benefits from a microphone structurehaving a plurality of microphones, with at least one microphoneoptionally being adapted to function in more than one mode.

In many representative embodiments, the electronic devices are portable.However, this is not essential. In particular, the microphone structuresof the present teachings are also contemplated for use indevices/apparatuses that are stationary; and devices/apparatuses thatare mobile, but are not ordinarily small enough to be consideredportable. For example, the microphone structures of representativeembodiments may be used in industrial machinery applications, motorvehicle applications, aircraft applications, and watercraftapplications, to name only a few.

Additionally, while the present description is drawn primarily tomicrophones, the present teachings contemplate applications totransducers in general. For example, as one of ordinary skill in the artwill readily appreciate, the present teachings may be applied topiezoelectric speakers.

FIG. 1 is a cross-sectional view of a PMT 100 in accordance with anillustrative embodiment. The PMT 100 comprises a substrate 101, amembrane layer 102 and an annular resonator 103. The annular resonator103 comprises a first electrode 104 disposed over the membrane layer102, a piezoelectric layer 105 and a second electrode 105. The PMT 100also comprises a cavity 107 formed in the substrate 101. Application ofa time-dependent voltage to the annular resonator 103 causes amechanical wave to be launched through the annular resonator 103 and themembrane layer 102. As the piezoelectric layer 105 oscillates inresponse to a mechanical perturbation (e.g., a sound wave), the forcesgenerated by the perturbation induce stresses in the piezoelectric layerresulting in generation of a voltage difference across the electrodes104, 106. Assuming the layer 105 of piezoelectric material (e.g., AlN,ZnO or lead zirconium titanate (PZT)) has a c-axis substantiallyorthogonal to the membrane surface (parallel to x in the coordinatesystem shown), the voltage sensitivity is proportional to the lateralstress, σ_(y), and the ratio of the piezoelectric strain matrixcoefficient (d₃₁) and the electric permittivity coefficient (833). Incertain embodiments the mechanical wave creates a flexure mode to belaunched in the membrane layer 102.

The membrane layer 102 illustratively comprises a material having athermal expansion coefficient (T_(CE)) that substantially matches thethermal expansion coefficient (T_(CE)) of the substrate 101. Themembrane layer 102 has a thickness equal to or greater than thethickness of the combined thickness of the layers of the annularresonator 103. Notably, substrate 101 and the membrane layer 102dominate the temperature characteristics of the PMT 100. Moreover, theareal dimension of the annular resonator 103 comprising the firstelectrode 104, the piezoelectric layer 105 and the second electrode 105is beneficially less than the areal dimension of the membrane layer 102,so that the impact of the resonator 103 on the thermal properties of thePMT 100 is comparatively small, if not negligible.

In accordance with a representative embodiment, the annular resonator103 has a circular shape. This is merely illustratively, and othershapes are clearly contemplated. For example, the annular resonator 103may be elliptical, square or generally polygonal, such as pentagonal. Inaccordance with a representative embodiment, the substrate 101 ismonocrystalline silicon, and the membrane layer 102 comprisesmonocrystalline silicon; or polycrystalline silicon (polysilicon) formedby low pressure chemical vapor deposition (LPCVD) or by plasma enhancedchemical vapor deposition (PECVD); or silicon carbide (SiC); or siliconnitride Si₃N₄. In other embodiments, the substrate 101 ismonocrystalline silicon and the membrane layer 103 comprises boron-dopedsilicon glass (borosilicate glass) with a boron concentration by weightof approximately 3.0% to approximately 6.0%. In other embodiments, thesubstrate 101 may comprise silicon-on-insulator (SOI), or may comprise afirst silicon wafer bonded to a second silicon wafer, which is thinnedby a known thinning process to provide a desired thickness of thesubstrate 101.

Selection of the material for the membrane layer 102 and its thicknessallows for the selection of the resonance frequency and sensitivity ofthe membrane over a selected temperature range. Notably, a change intemperature will result in a change in the stress in the membrane layer102. In turn, a change in the stress in the material will result in achange in the resonance frequency and the sensitivity of the membranelayer 102. Selection of a material that substantially matches thethermal expansion coefficient (T_(CE)) of the substrate 101 will ensurethat thermally induced stress in the material used for the membrane 102will be predictable over a temperature range of interest. Specifically,because the material selected for the membrane layer 102 has a thermalexpansion coefficient (T_(CE)) that substantially matches the thermalexpansion coefficient (T_(CE)) of the substrate 101, the substrate 101and the membrane layer 102 expand and contract at substantially the samerate versus temperature. As a result, the stress in the membrane layerremains substantially constant with changes in temperature. Accordingly,because the change in stress in the membrane layer 102 due to a changein temperature will alter the resonant frequency of the membrane layer102 by a predictable amount. Likewise, a change in temperature willalter the sensitivity of the membrane layer 102 to a predictable amount,the sensitivity will change by a predictable amount For purposes ofillustration and not limitation, the operating temperature range of thePMT 100 is approximately −40° C. to approximately +60° C. Inrepresentative embodiments, this results in a change in the resonantfrequency of the membrane layer 102 of approximately −3% toapproximately +3%.

In accordance with a representative embodiment, selection of thematerials for the substrate 101 and the membrane layer 102 results in asubstantially constant resonant frequency and sensitivity of themembrane layer 102. In certain embodiments, the thermal coefficient ofexpansion (T_(CE)) of the membrane layer 102 is greater than the thermalexpansion coefficient (T_(CE)) of the substrate 101. In suchembodiments, as the temperature increases, the stress in the membranelayer 102 becomes more compressive; and when the temperature decreases,the stress in the membrane layer 102 becomes more tensile. In otherembodiments, the thermal coefficient of expansion (T_(CE)) of themembrane layer 102 is less than the thermal expansion coefficient(T_(CE)) of the substrate 101. In such embodiments, as the temperatureincreases, the stress in the membrane layer 102 becomes more tensile;and when the temperature decreases, the stress in the membrane layer 102becomes more compressive.

Mechanical waves launched from or incident on the membrane layer 103travel through a cavity 107 and an opening 108. In a representativeembodiment, a micromachined structure comprises the substrate 101 andthe membrane layer 102 spanning the cavity 107. Notably, the annularresonator 103 disposed over the membrane layer 102 is merelyillustrative, and use of other resonator structures disposed over themembrane layer 102 of the micromachined structure are contemplated.

In another representative embodiment, the opening 108 is foregone. Inthis embodiment, the annular resonator 103 is provided over the cavity107. In this case the acoustic waves are incident on and radiated awayfrom the front surface of the membrane layer 102.

The cavity 107 spans a distance d1 as shown in FIG. 1. This distancecreates the boundary conditions for the equations of motion of themembrane layer 102; with the ends of the cavity 107 defined by thedistance d1 and thereby the active region of the membrane 102. As shouldbe appreciated by one of ordinary skill in the art. the fundamentalflexure mode is determined in part by the distance d1. Accordingly, thepresent teachings beneficially contemplate forming the dimension d1 andthe dimensions of the cavity 107 generally with precision to provide aparticular fundamental flexure mode in the membrane, and thereby adesired fundamental frequency of operation.

In a representative embodiment, the areal shape of the cavity 107 andthus the membrane is circular, and thus the dimension d1 is a diameter.This is merely illustrative, and the membrane may be of other arealshapes including a square, or an ellipse. Notably, the areal shape ofthe annular resonator 103 may be substantially the same as that of thecavity 107, or of a different annular shape than that of the cavity 107.In either case, the annular resonator 103 is disposed over the membranelayer 102 and the cavity 107. The opening 108 spans a distance d2, andcomprises an areal shape that may be substantially same as to that ofthe cavity 107 or may be different than the areal shape of the cavity107. The distance d2 is less than or equal to the distance d1, as theareal dimensions of the opening 108 cannot be greater than the arealdimensions of the cavity. To this end, as described below fabrication ofthe cavity 107 is comparatively precise and reproducible so that amembrane of a desired fundamental flexure mode can be realized in arepeatable manner. By contrast, the opening 108 is fabricated by lessprecise methods and, as such, if the areal dimension of opening 108 isgreater than that of the cavity 107, the precision of the membrane iscontrolled by the fabrication of the opening 108 and not the cavity. Assuch, the precision and reproducibility of the membrane is compromised.Notably, a known etching technique, the Bosch etching method, may beused to etch the opening 108. If cavity 107 were not present, cavity 108then would define d1. Using the Bosch method alone to form the opening108 without the cavity 107, there would be comparatively highuncertainty in the dimension d1. For a typical process, this would begreater than 10 μm. However, by etching the cavity 107 as describedabove, and then etching the opening 108, d1 can be fabricated with aprecision of 1 μm or less, or approximately ten times more preciselythan use of the Bosch method alone.

The annular resonator 103 disposed over the cavity 107 includescharacteristics of a film bulk acoustic resonator (FBAR), such asdescribed in patents and patent publications referenced below. While oneresonator stack (i.e., first electrode 104, the piezoelectric layer 105and the second electrode 106) is shown, more than one resonator stack iscontemplated. For example, another resonator stack comprising the firstand second electrodes 104, 106 and the piezoelectric layer 103 may beprovided over the resonator stack shown in FIG. 1. This structure hassimilar characteristics as a stack bulk acoustic resonator (SBAR). TheSBAR is fabricated by repeating the fabrication sequence of theresonator stack after forming the resonator stack shown in FIG. 1, andbefore removing sacrificial material as discussed below.

FIGS. 2A-2F shows cross-sectional views of a fabrication sequence inaccordance with a representative embodiment. Methods, materials andstructures of the PMT 100 may be as described in commonly owned U.S.Patent Application Publications: 20080122320 and 20080122317 to Fazzio,et al.; 20070205850 to Jamneala, et al.; 20080258842 to Ruby, et al.;and 20060103492 to Feng, et al.; and may be as described in commonlyowned U.S. Pat. Nos. 5,587,620; 5,873,153; 6,384,697; 6,507,983; and7,275,292 to Ruby, et al.; 6,828,713 to Bradley, et. al. The disclosuresof these patents and patent application publications are specificallyincorporated herein by reference. Notably, the teachings of thesepatents and patent publications is intended to be illustrative ofmethods, materials and structures useful to the present teachings, butin no way limiting to the present teachings.

FIG. 2A shows the substrate 101 having the cavity 107 formed therein bya known method. In a representative embodiment, the substrate 101comprises silicon, and the cavity 107 is formed by a known wet etchingor dry etching techniques. Additional details of the method offabricating the cavity 107 are described in the incorporated patents andpatent publications. Regardless of the method selected for fabricatingthe cavity 107, the degree of precision in the dimensions of the cavity107 and its reproducibility in large scale allows the setting of andconsistency of the resonant frequency of the PMT 100.

FIG. 2B shows the substrate 101, having the cavity 107 substantiallyfilled with a sacrificial material 201. As described in the incorporatedpatents and patent publications, the sacrificial material isillustratively silicon dioxide (SiO₂) or phosphosilicate glass (PSG)formed using a known deposition or growth method. After the sacrificiallayer 201 is provided in the cavity 107, a polishing step, such aschemical mechanical polishing (CMP) is performed so that a surface 202of the sacrificial layer 201 is substantially flush with a surface 203of the substrate 101. FIG. 2C shows the substrate 101 after the formingof the membrane layer 102. In accordance with a representativeembodiment, the membrane layer 102 comprises boron doped SiO₂ commonlyreferred to as borosilicate glass (BSG). In other representativeembodiments, the membrane layer 102 comprises one of polysilicon(poly-Si), or silicon nitride (Si₃N₄) or silicon carbide (SiC). Thesematerials are merely illustrative, and other materials are contemplatedfor use as the membrane layer 102. Notably, the material selected forthe membrane 102 should be reproducibly fabricated with consistentdesired material properties such as film stress and thickness in anarray of PMTs 100 or across a wafer in large-scale fabrication).Accordingly, to realize sufficient accuracy in the resonant frequency,and reproducibility from one transducer (PMT) to the next infabrication, it is important to control the thickness of the membranelayer 102 and the film stress of the membrane layer 102. In choosing thematerial, other parameters of interest are stiffness. robustness,environmental compatibility. Illustratively, a layer of BSG having athickness in the range of approximately 0.1 μm to approximately 20.0 μmmay be used for the membrane layer 102.

Regardless of the material selected for the membrane layer 102,formation of this layer is effected by a known method and withconsiderations for other processes used in the fabrication of the PMT100.

FIG. 2D shows the substrate 101 after the forming of a first conductivelayer 204, a piezoelectric layer 205 and a second conductive layer 206are provided over the membrane layer 102. These layers are formed usingknown methods and materials, such as described in one or more theincorporated U.S. patents and Patent Publications, and are not repeatedso as to avoid obscuring the description of the present embodiments.

FIG. 2F shows the substrate 101 after the patterning and etching of thefirst conductive layer 204, the piezoelectric layer 205 and the secondconductive layer 206 to provide the annular resonator 103 comprising thefirst electrode 104, the piezoelectric layer 105 and the secondelectrode 106 over the membrane layer 102. As described in connectionwith the embodiment of FIG. 1, the annular resonator 103 may be circularin areal shape, or may be square in areal shape, or may be other thancircular or square in areal shape. Regardless of the areal shape of theannular resonator 103, the fabrication of the first electrode 104, thesecond electrode 106 and the piezoelectric layer 105 illustratively maybe effected according to the teachings of U.S. Patent ApplicationPublications: 20080122320 and 20080122317 to Fazzio, et al.

FIG. 2F shows the substrate 101 after etching to form the opening 108.The etching of the substrate to form the opening 108 is illustrativelyeffected by deep reactive ion etching (DRIE), or the so-called BoschMethod. Alternatively a wet etch commensurate for use with the remainingmaterials shown in FIG. 2E may be used to provide the opening 108. Aftercompletion of the formation of the opening 108. the sacrificial layer201 is removed according to a known method, for example as described inone or more of the incorporated above. After the removal of thesacrificial layer, the PMT 100 shown in FIG. 1 is realized.

FIG. 3 shows a PMT 300 in cross-section in accordance with arepresentative. Many of the features, materials and methods offabricating the PMT 300 are common to those above provided in connectionwith the embodiments of FIGS. 1-2F. Generally, common details are notrepeated to avoid obscuring the description of the presently describedembodiments.

The PMT 300 comprises the substrate 101 substrate 101, the membranelayer 102 and the annular resonator 103. The annular resonator 103comprises the first electrode 104 disposed over the membrane layer 102,the piezoelectric layer 105 and the second electrode 105.

The PMT 300 also comprises the cavity 107 formed in the substrate 101.The PMT 300 does not comprise the opening 108. Notably, the PMT 300 isdesigned so that mechanical waves are transmitted to or received from aside 301, which is the side of the PMT 300 opposing a backside surface302 of the substrate 101. In order to facilitate a flexure mode of asuitable amplitude in the membrane layer 102, a vent 303 is provided tofoster pressure equalization between the pressures on each side of themembrane layer 102. Thus, the vent 303 promotes equal pressure in thecavity 107 as in the ambient region of the PMT 300.

Application of a time-dependent voltage to the annular resonator 103causes a mechanical wave to be launched through the annular resonator103 and the membrane layer 102. As the piezoelectric layer 105oscillates in response to a mechanical perturbation (e.g., a soundwave), the forces generated by the perturbation induce stresses in thepiezoelectric layer resulting in generation of a voltage differenceacross the electrodes 104, 106. Assuming the layer 105 of piezoelectricmaterial (e.g., AlN, ZnO or lead zirconium titanate (PZT)) has a c-axissubstantially orthogonal to the membrane surface (parallel to x in thecoordinate system shown), the voltage sensitivity is proportional to thelateral stress, σ_(y), and the ratio of the piezoelectric strain matrixcoefficient (d₃₁) and the electric permittivity coefficient (ε₃₃).Beneficially, the mechanical wave creates a flexure mode to be launchedin the membrane layer 102. Mechanical waves launched from or incident onthe membrane layer travel from side 301. The cavity 107 spans a distanced1 as shown in FIG. 3, and comprises the active area of the membrane ofthe PMT 300. Similarly, in a receiving mode, mechanical waves incidenton an annular resonator are converted into flexural modes in the layer105 and to time-dependent voltages due to the piezoelectric affect.Receiver electronics (not shown) then process the voltage signals.

FIG. 4A shows in cross-section the substrate 101 comprising the cavity107 filled with the sacrificial layer 201. The CMP step described abovehas been completed, and the membrane layer 102 has been provided overthe substrate 101 and sacrificial layer 201. FIG. 4B shows incross-section the substrate 101 comprising the cavity 107 filled withthe sacrificial layer 201, after forming of the vent 303. The vent 303is formed by a known patterning and etching method, and may befabricated for example as described in U.S. Pat. No. 6,384,697. The vent303 serves several functions in the PMTs of the representativeembodiments. Beneficially, the vent 303 serves to equalize pressure onboth sides of the membrane layer 1032. In the case where opening 107 issealed during product assembly, the vent 303 provides and controls thelow-frequency behavior of the transducer frequency response. Thedimensions and placement of the vent 303 are selected to achieve theseand other benefits.

FIG. 4C shows a lop view of the substrate 101 comprising the cavity 107filled with the sacrificial layer 201, after forming of the vent 303.where the section line 4B-4B denotes the perspective of FIG. 4B.Notably, FIG. 4C shows the structure before forming of the annularresonator 103. Also, as shown, the areal dimension of the cavity 107 issubstantially square, although this is merely illustrative, and otherareal shapes are contemplated. As noted above, the areal shape of theannual resonator 103 may be of the same areal shape or of a differentareal shape that the cavity 107.

FIG. 5 shows a cross-sectional view of a PMT 500 in accordance with arepresentative embodiment. The PMT 500 comprises components andmaterials common to the representative embodiments described inconnection with FIGS. 1-4C; and is fabricated by methods described abovein connection with these embodiments. Because many of the details of thecomponents, materials and manufacturing methods are common to thosedescribed previously, such details are not repeated in order to avoidobscuring the presently described embodiments.

The PMT 500 comprises a passivation layer 501. The passivation layer 501is provided over a surface of the PMT 100 as shown. Notably, in therepresentative embodiment, the passivation layer 501 is provided overthe membrane 102 and the annular resonator 103, and about the layersthereof.

In representative embodiments, the passivation layer 501 may be SiC orSi₃N₄ or BSG, and is deposited by a selected known method.Illustratively, the passivation layer 501 has a thickness ofapproximately 1000 Angstroms to approximately 5000 Angstroms. Inaccordance with certain representative embodiments, the passivationlayer 501 is selected to have a thermal expansion coefficient (T_(CE))that substantially matches the thermal expansion coefficient (T_(CE)) ofthe membrane layer 102 and the substrate 101. In certain embodiments,the material selected for the passivation layer 501 is substantiallyidentical to that of the membrane layer 102.

As will be appreciated by one of ordinary skill in the art, manyvariations that are in accordance with the present teachings arepossible and remain within the scope of the appended claims. These andother variations would become clear to one of ordinary skill in the artafter inspection of the specification, drawings and claims herein. Theinvention therefore is not to be restricted except within the spirit andscope of the appended claims.

1.-9. (canceled)
 10. A method of fabricating a piezoelectricmicromachined transducer (PMT), the method comprising: providing asubstrate comprising a surface and an opposing surface; forming a cavityin the substrate; forming a membrane layer over the surface andsubstantially spanning the cavity; forming an annular transducer overthe membrane layer, the annular transducer comprising a first electrode,a second electrode and a piezoelectric layer between the first electrodeand the second electrode.
 11. A method as claimed in claim 10, furthercomprising forming an opening through the opposing surface and in tandemwith the cavity.
 12. A method as claimed in claim 9, wherein the cavitycomprises a first width and the opening comprises a second width.
 13. Amethod as claimed in claim 9, wherein the forming the opening comprisesa deep reactive ion etching method.
 14. A method as claimed in claim 9,further comprising forming a vent extending into the cavity and out ofthe surface of the substrate.
 15. A method as claimed in claim 11,wherein the first width is less than the second width.
 16. A method asclaimed in claim 10, wherein the membrane layer comprises borosilicateglass.
 17. A method as claimed in claim 10, wherein the membrane layercomprises one of: polysilicon (poly-Si), or silicon nitride (Si3N4) orsilicon carbide (SiC). 18.-21. (canceled)